Analysis of Black Mura Caused by Photo Ioff. (17th July 2020)

• Record Type: Journal Article
• Authors: Li, Zongxiang; Liu, Yao; Yun, Xiangnan; Wang, Baoqiang; Li, Liangliang; Feng, Yuchun; Liu, Zheng; Chen, Xi; Wu, Hongjiang
• Is Part Of: Digest of technical papers. Volume 51(2020)Supplement 1
• Page Start: 97
• Page End: 100
• Publication Date: 2020-07-17
• Subjects: Black Mura -- photo Ioff -- storage capacitance -- Active First and Pre-ashing; Information display systems -- Congresses; 621.3815422
• DOI: 10.1002/sdtp.13762
• Languages: English
• ISSNs: 0097-966X

Abstract

Abstract : The researched Black Mura partly occurred in TFT‐LCD which is caused by the bigger photo Ioff in this area. Direct evidence is given through a theoretical calculation method, by which brightness difference between Black Mura area and normal area can be got, it is corresponding by contrast with the actual data and influenced by storage capacitance and ΔIoff through a fitting formula. Besides, the difference between Active First and Pre‐ashing is given which is the root cause in this case.