Cite
HARVARD Citation
Magnone, P. et al. (2020). "Limiting power cycling stress in power MOSFETs by active thermal control". Microelectronics and reliability. p. . [Online].
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Magnone, P. et al. (2020). "Limiting power cycling stress in power MOSFETs by active thermal control". Microelectronics and reliability. p. . [Online].