Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD. (August 2020)

• Record Type: Journal Article
• Authors: Ernould, Clément; Beausir, Benoît; Fundenberger, Jean-Jacques; Taupin, Vincent; Bouzy, Emmanuel
• Is Part Of: Scripta materialia. Number 185(2020)
• Page Start: 30
• Page End: 35
• Publication Date: 2020-08
• Subjects: On-axis Transmission Kikuchi Diffraction (TKD) -- HR-TKD -- Nanostructured materials -- Severe Plastic Deformation (SPD) -- Electron diffraction; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2020.04.005
• Languages: English
• ISSNs: 1359-6462

Abstract

Abstract: Global Digital Image Correlation (DIC) is applied on the electron diffraction patterns acquired by the "on-axis" Transmission Kikuchi Diffraction (TKD) technique. High-angular resolution (HR-TKD) mappings of the grain internal disorientations and the associated geometrically necessary dislocation densities are then derived at a nanoscale resolution. Tailored for the fine characterization of nanomaterials in the scanning electron microscope (SEM), the method is illustrated on a nanostructured high-purity aluminium processed by severe plastic deformation (SPD) and its performances are discussed in the light of imaging by transmission electron microscopy (TEM) and by SEM using a forescatter electron detector (FSD). Graphical abstract: Image, graphical abstract