Characterization and stability monitoring of X-ray focal spots. Issue 1 (2020)

• Record Type: Journal Article
• Authors: Probst, Gabriel M.; Hou, Qinhan; Boeckmans, Bart; Xiao, YongShun; Dewulf, Wim
• Is Part Of: CIRP annals. Volume 69:Issue 1(2020)
• Page Start: 453
• Page End: 456
• Publication Date: 2020
• Subjects: Metrology -- X-ray -- Focal spot; Production engineering -- Research -- Periodicals; 670.5
• DOI: 10.1016/j.cirp.2020.04.072
• Languages: English
• ISSNs: 0007-8506

Abstract

Abstract: The characteristics of the X-ray focal spot strongly influence XCT image sharpness and structural resolution. However, current international standards only yield a limited characterization of the focal spot as two perpendicular sizes. Therefore, this paper presents a method for full characterization of the focal spot in terms of both 2D shape and intensity distribution, by applying the inverse Radon transform on a radiograph of a Siemens star. The method is validated through simulations and applied experimentally to two XCT sources. Subsequently, an investigation on how the X-ray tube settings influence focal spot size, shape, intensity and stability is presented.