Cite
HARVARD Citation
Van der Laan, L. et al. (2020). Genetic responses in milling, flour quality, and wheat sensitivity traits to grain yield improvement in U.S. hard winter wheat. Journal of cereal science. p. . [Online].
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Van der Laan, L. et al. (2020). Genetic responses in milling, flour quality, and wheat sensitivity traits to grain yield improvement in U.S. hard winter wheat. Journal of cereal science. p. . [Online].