30 Years of atomic force microscopy: Creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners. (15th July 2020)

• Record Type: Journal Article
• Authors: Habibullah, H.
• Is Part Of: Measurement. Volume 159(2020)
• Publication Date: 2020-07-15
• Subjects: Atomic force microscopy -- Piezoelectric tube scanner -- Vibration control; Weights and measures -- Periodicals; Measurement -- Periodicals; Measurement; Weights and measures; Periodicals; 530.8
• DOI: 10.1016/j.measurement.2020.107776
• Languages: English
• ISSNs: 0263-2241

Abstract

Graphical abstract: Combined effects of creep, hysteresis, and cross-coupling in the AFM image at 10 Hz using the proposed method and in-built AFM PI controller. Highlights: A brief history and applications of an atomic force microscopy. Problems of a piezoelectric actuator-sensor tube used in a microscopy. Limiting factors of a piezoelectric scanner for achieving high speed imaging. Direction for future works in nanopositioning control has been outlined. Abstract: This paper presents a brief history of scanning probe microscopes (SPMs) and a general insight into an atomic force microscope (AFM), including its operating principles, modes, main components and limitations for achieving high-precision nanopositioning and image scanning. A piezoelectric tube scanner (PTS) is made of a piezoelectric material (PZM) and used in an AFM to position a sample in the sub-nanometric range. As atomic force microscopes (AFMs) are becoming workhorses in investigations in the field of nanometric-range surface profiling of material and biological samples, the high-precision nano-positioning of their PTS is a major requirement for high-speed imaging. The scanning speed of a commercial AFM is limited by the positioning accuracy of its scanner which has the following problems: (i) creep effect in slow-speed scanning; and (ii) hysteresis effect during large-range scanning (which both result in inaccurate reference motion tracking); (iii) cross-coupling effect among the axes of the scanner; and (iv) vibration effect at high frequencies due to its mechanical properties. During the last three decades, high-speed imaging using an AFM has been attempted by applying a suitable controller, using alternative scanning methods or changing the hardware setup.