Ag8+ ion irradiation modulated structural, microstructural, defect, and magnetization in ZnO thin films. (June 2020)
- Record Type:
- Journal Article
- Title:
- Ag8+ ion irradiation modulated structural, microstructural, defect, and magnetization in ZnO thin films. (June 2020)
- Main Title:
- Ag8+ ion irradiation modulated structural, microstructural, defect, and magnetization in ZnO thin films
- Authors:
- Gupta, Goutam Kumar
Saini, Lokesh
Ojha, Sunil
Tripathi, Balram
Avasthi, Devesh K.
Dixit, Ambesh - Abstract:
- Abstract: The irradiation effect of high energy silver ion (Ag 8+ ) has been investigated on ZnO thin films to understand their impact on structural, microstructural, optical, electronic and magnetic properties. The RF sputtered pristine ZnO/Si thin films are polycrystalline and highly textured along (0 0 2) plane. The irradiated ZnO/Si samples showed enhanced structural and microstructural defects with irradiation time. The lattice parameters have reduced for irradiated ZnO thin films, suggesting structural deformation. The irradiation has resulted into enhanced defect density and strain in these thin films. A weak room temperature ferromagnetic moment (3.24 × 10 −4 emu cm −2 ) has been observed, which has reduced drastically for Ag 8+ irradiated samples up to 1.05 × 10 −4 emu cm −2 . The observed reduction in saturation magnetization has been attributed to the enhanced microstructural defects, lowering the free charge carriers and increasing the recombination centers simultaneously. Highlights: Impact of Ag 8+ high energy ion irradiation on ZnO thin films. Pristine ZnO thin films showed weak ferromagnetism. Structural disortion after Ag 8+ irradiation, exhibiting smaller lattice parameter. Irradiation induced defects let to reduction in the ferromagnetic moment.
- Is Part Of:
- Vacuum. Volume 176(2020)
- Journal:
- Vacuum
- Issue:
- Volume 176(2020)
- Issue Display:
- Volume 176, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 176
- Issue:
- 2020
- Issue Sort Value:
- 2020-0176-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-06
- Subjects:
- Oxide semiconductors -- Thin films -- X-ray diffraction -- Defects -- Rutherford backscattering -- Magnetism
Vacuum -- Periodicals
621.55 - Journal URLs:
- http://www.elsevier.com/journals ↗
http://www.sciencedirect.com/science/journal/0042207X ↗ - DOI:
- 10.1016/j.vacuum.2020.109342 ↗
- Languages:
- English
- ISSNs:
- 0042-207X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 9139.000000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 13426.xml