Electron-beam charging of sapphire preirradiated by Arn+ clusters. (July 2020)

• Record Type: Journal Article
• Authors: Tatarintsev, A.A.; Ieshkin, A.E.; Kireev, D.S.; Ozerova(Markovets), K.E.
• Is Part Of: Vacuum. Volume 177(2020)
• Publication Date: 2020-07
• Subjects: Charging -- Cluster ions -- Electron emission -- Radiation defects -- Sapphire; Vacuum -- Periodicals; 621.55
• DOI: 10.1016/j.vacuum.2020.109374
• Languages: English
• ISSNs: 0042-207X

Abstract

Abstract: Kinetics of sapphire single crystals charging under electron beam irradiation has been studied. The electron beam energy was 5 and 15 keV. The sapphire was preliminary irradiated with ArN + cluster ions with the energy of 7–15 keV. The charging characteristics of virgin sapphire samples and those of the samples irradiated with atomic Ar + and cluster ArN + ions were compared. It was found that cluster ion preirradiation reduces the charging time of sapphire by almost two orders of magnitude. Possible explanations of the phenomenon are discussed. Highlights: ∙ Cluster ion irradiation results in faster electron beam charging of sapphire ∙Charging kinetics varies with the cluster irradiation dose ∙On the first stage of electron irradiation, partial discharging may take place ∙Defect layer supposed to determine the emission characteristic and charging pattern