X‐ray optics and beam characterization using random modulation: theory. (20th February 2020)

• Record Type: Journal Article
• Authors: Berujon, Sebastien; Cojocaru, Ruxandra; Piault, Pierre; Celestre, Rafael; Roth, Thomas; Barrett, Raymond; Ziegler, Eric
• Is Part Of: Journal of synchrotron radiation. Volume 27:Part 2(2020)
• Page Start: 284
• Page End: 292
• Publication Date: 2020-02-20
• Subjects: speckle -- near‐field speckle‐based phase‐sensing -- metrology -- at‐wavelength metrology -- optics; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577520000491
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : A theoretical review is provided of the X‐ray near‐field speckle‐based phase‐sensing approach and its associate processing schemes available for optics and beam characterization. Abstract : X‐ray near‐field speckle‐based phase‐sensing approaches provide efficient means of characterizing optical elements. Presented here is a theoretical review of several of these speckle methods within the framework of optical characterization, and a generalization of the concept is provided. As is also demonstrated experimentally in a parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, (this issue)], the methods theoretically developed here can be applied to different beams and optics and within a variety of situations where at‐wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the most suitable approach for each metrology scenario.