Cite
HARVARD Citation
He, K. et al. (2020). The profile inter‐unit reliability. Biometrics. 76 (2), pp. 654-663. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
He, K. et al. (2020). The profile inter‐unit reliability. Biometrics. 76 (2), pp. 654-663. [Online].