Cite
HARVARD Citation
Krause, L. et al. (2020). Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector. Journal of applied crystallography. 53 (3), pp. 635-649. [Online].
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Krause, L. et al. (2020). Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector. Journal of applied crystallography. 53 (3), pp. 635-649. [Online].