X‐ray fluorescence detection for serial macromolecular crystallography using a JUNGFRAU pixel detector. (11th February 2020)

• Record Type: Journal Article
• Authors: Martiel, Isabelle; Mozzanica, Aldo; Opara, Nadia L.; Panepucci, Ezequiel; Leonarski, Filip; Redford, Sophie; Mohacsi, Istvan; Guzenko, Vitaliy; Ozerov, Dmitry; Padeste, Celestino; Schmitt, Bernd; Pedrini, Bill; Wang, Meitian
• Is Part Of: Journal of synchrotron radiation. Volume 27:Part 2(2020)
• Page Start: 329
• Page End: 339
• Publication Date: 2020-02-11
• Subjects: serial crystallography -- macromolecular crystallography -- fluorescence -- JUNGFRAU detector -- XFELs -- silicon drift detectors; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577519016758
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : Use of the charge‐integrating JUNGFRAU detector for fluorescence detection is investigated, and its applications in macromolecular crystallography at synchrotron and X‐ray free‐electron laser sources are demonstrated. Abstract : Detection of heavy elements, such as metals, in macromolecular crystallography (MX) samples by X‐ray fluorescence is a function traditionally covered at synchrotron MX beamlines by silicon drift detectors, which cannot be used at X‐ray free‐electron lasers because of the very short duration of the X‐ray pulses. Here it is shown that the hybrid pixel charge‐integrating detector JUNGFRAU can fulfill this function when operating in a low‐flux regime. The feasibility of precise position determination of micrometre‐sized metal marks is also demonstrated, to be used as fiducials for offline prelocation in serial crystallography experiments, based on the specific fluorescence signal measured with JUNGFRAU, both at the synchrotron and at SwissFEL. Finally, the measurement of elemental absorption edges at a synchrotron beamline using JUNGFRAU is also demonstrated.