X‐ray optics and beam characterization using random modulation: experiments. (20th February 2020)

• Record Type: Journal Article
• Authors: Berujon, Sebastien; Cojocaru, Ruxandra; Piault, Pierre; Celestre, Rafael; Roth, Thomas; Barrett, Raymond; Ziegler, Eric
• Is Part Of: Journal of synchrotron radiation. Volume 27:Part 2(2020)
• Page Start: 293
• Page End: 304
• Publication Date: 2020-02-20
• Subjects: speckle -- near‐field speckle‐based phase‐sensing -- metrology -- at‐wavelength metrology -- optics; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577520000508
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : The X‐ray near‐field speckle‐based phase‐sensing approach and its associated processing schemes are illustrated experimentally in the context of optics and beam characterization. Abstract : A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, 284–292] reviewed theoretically some of the available processing schemes for X‐ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X‐ray at‐wavelength metrology methods can assist the manufacture of X‐ray optics that transport X‐ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics.