A one‐port automatic fixture removal method for de‐embedding. (22nd May 2019)

• Record Type: Journal Article
• Authors: Xie, Chengcheng; Xu, Ruimin
• Other Names: Xu Yuehang guestEditor.
• Is Part Of: International journal of numerical modelling. Volume 33:Number 3(2020)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2019-05-22
• Subjects: calibration -- de‐embedding -- fixture -- S‐parameter -- TDR; Electric networks -- Mathematical models -- Periodicals; Electronics -- Mathematical models -- Periodicals; 621.3011
• DOI: 10.1002/jnm.2622
• Languages: English
• ISSNs: 0894-3370

Abstract

Abstract: Traditional calibration methods and measurement‐based de‐embedding processes require the design of calibration kits and measurement standards, and the processes are cumbersome and costly. Even the simple automatic fixture removal (AFR) with 2x‐through fixtures still needs a through line to extract the fixtures' characteristics, and there are some restrictions. With one‐port AFR (1xAFR), the open fixture's time domain response (TDR) could be gated and windowed, then extracted to fixture's through S‐parameter. When the fixture is connected to device under test (DUT), its response could be de‐embedded from the blended S‐parameter and the DUT's S‐parameter could be obtained. In this paper, the basic principle and extraction process of 1xAFR are described, and two measurement cases are demonstrated to verify 1xAFR's ease of use and accuracy.