High‐efficiency ultra‐precision comparator for d‐spacing mapping measurement of silicon. (13th March 2020)

• Record Type: Journal Article
• Authors: Yang, Junliang; Li, Tang; Zhu, Ye; Zhang, Xiaowei; Waseda, Atsushi; Fujimoto, Hiroyuki
• Is Part Of: Journal of synchrotron radiation. Volume 27:Part 3(2020)
• Page Start: 577
• Page End: 582
• Publication Date: 2020-03-13
• Subjects: self‐referenced lattice comparator -- d‐spacing of silicon -- 1D X‐ray photon‐counting detector -- pencil beam -- brush beam; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577520001496
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : The development of a wide‐beam ultra‐precision d ‐spacing mapping measurement system that is more than ten times faster than the previous pencil‐beam method is presented. Abstract : This article describes a high‐efficiency experimental configuration for a self‐referenced lattice comparator with a `brush beam' of synchrotron radiation from a bending magnet and two linear position‐sensitive photon‐counting‐type X‐ray detectors. The efficiency is more than ten times greater compared with the `pencil‐beam' configuration and a pair of zero‐dimensional detectors. A solution for correcting the systematic deviation of d ‐spacing measurements caused by the horizontal non‐uniformity of the brush beam is provided. Also, the use of photon‐counting‐type one‐dimensional detectors not only improves the spatial resolution of the measurements remarkably but can also adjust the sample's attitude angles easily.