Cite
HARVARD Citation
Shiojima, K. et al. (2020). Effect of Wafer Off‐Angles on Defect Formation in Drift Layers Grown on Free‐Standing GaN Substrates. Physica status solidi. 257 (4), p. n/a. [Online].
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Shiojima, K. et al. (2020). Effect of Wafer Off‐Angles on Defect Formation in Drift Layers Grown on Free‐Standing GaN Substrates. Physica status solidi. 257 (4), p. n/a. [Online].