Cite
HARVARD Citation
Mart, C. et al. (2020). Piezoelectric Response of Polycrystalline Silicon‐Doped Hafnium Oxide Thin Films Determined by Rapid Temperature Cycles. Advanced Electronic Materials. p. n/a. [Online].
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Mart, C. et al. (2020). Piezoelectric Response of Polycrystalline Silicon‐Doped Hafnium Oxide Thin Films Determined by Rapid Temperature Cycles. Advanced Electronic Materials. p. n/a. [Online].