Removing Stripes, Scratches, and Curtaining with Nonrecoverable Compressed Sensing. (June 2019)

• Record Type: Journal Article
• Authors: Schwartz, Jonathan; Jiang, Yi; Wang, Yongjie; Aiello, Anthony; Bhattacharya, Pallab; Yuan, Hui; Mi, Zetian; Bassim, Nabil; Hovden, Robert
• Is Part Of: Microscopy and microanalysis. Volume 25:Number 3(2019)
• Page Start: 705
• Page End: 710
• Publication Date: 2019-06
• Subjects: electron microscopy, -- destriping, -- compressed sensing, -- electron tomography, -- FIB tomography; Microscopy -- Periodicals; Microchemistry -- Periodicals; 502.82
• DOI: 10.1017/S1431927619000254
• Languages: English
• ISSNs: 1431-9276

Abstract

Abstract: Highly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image striping from beam instability degrade the interpretability of micrographs. These unwanted, aperiodic features extend the image along a primary direction and occupy a small wedge of information in Fourier space. Deleting this wedge of data replaces stripes, scratches, or curtaining, with more complex streaking and blurring artifacts—known within the tomography community as "missing wedge" artifacts. Here, we overcome this problem by recovering the missing region using total variation minimization, which leverages image sparsity-based reconstruction techniques—colloquially referred to as compressed sensing (CS)—to reliably restore images corrupted by stripe-like features. Our approach removes beam instability, ion mill curtaining, mechanical scratches, or any stripe features and remains robust at low signal-to-noise. The success of this approach is achieved by exploiting CS's inability to recover directional structures that are highly localized and missing in Fourier Space.