Phase II synthetic exponential charts and effect of parameter estimation. Issue 1 (2nd January 2018)

• Record Type: Journal Article
• Authors: Cheng, Yuan; Sun, Lirong; Guo, Baocai
• Is Part Of: Quality technology & quantitative management. Volume 15:Issue 1(2018)
• Page Start: 125
• Page End: 142
• Publication Date: 2018-01-02
• Subjects: Synthetic chart -- average run length -- process mean -- time-between-events; Quality control -- Periodicals; Quality control -- Statistical methods -- Periodicals; Industrial management -- Periodicals; Industrial management; Management -- Research -- Methodology -- Periodicals; Qualitative research -- Periodicals; Management; Quality control; Quality control -- Statistical methods; Periodicals; 658.00721
• DOI: 10.1080/16843703.2017.1304046
• Languages: English
• ISSNs: 1684-3703

Abstract

Abstract : Exponential charts for monitoring time-between-events data are widely studied recently as it has shown a wide range in different applications. To improve the sensitivity of the simple exponential chart, this paper develops a synthcontrol chart to monitor the two-sided shifts in the exponential mean. This synthetic chart consists of an exponential sub-chart and a conforming run length (CRL) sub-chart and it is designed from two new perspectives. Previous synthetic charts are constructed based on the optimization program for a specified shift size, which proves to be difficult to predict in practice. In this paper, the synthetic chart is constructed based on a new design method which takes the mean (ARL) and the standard deviation (SDRL) of the run length into consideration. The other improvement is that the exponential sub-chart is designed to ensure that the CRL sub-chart only needs a lower control limit and that the proposed synthetic chart is ARL-unbiased. The effect of parameter estimation on the proposed synthetic chart is also studied in this paper. Performance comparisons show that our proposed chart has a better performance in general.