Chemical mechanism of chemical mechanical polishing of tungsten cobalt cemented carbide inserts. (April 2020)
- Record Type:
- Journal Article
- Title:
- Chemical mechanism of chemical mechanical polishing of tungsten cobalt cemented carbide inserts. (April 2020)
- Main Title:
- Chemical mechanism of chemical mechanical polishing of tungsten cobalt cemented carbide inserts
- Authors:
- Mao, Meijiao
Chen, Wentao
Liu, Jingli
Hu, Zihua
Qin, Changjiang - Abstract:
- Abstract: To explore the chemical mechanism of tungsten‑cobalt cemented carbide inserts in H2 O2 -based polishing fluid. Before and after the YG8 cemented carbide inserts were corroded, surface phase, element and structure were characterized by XRD and SEM/EDS. The chemical mechanism of tungsten‑cobalt carbide inserts during chemical mechanical polishing (CMP) was analyzed. XPS was utilized to analyze the corrosion products formed on the surface of YG8 cemented carbide inserts during chemical reaction to determine the chemical reaction equation. In the H2 O2 environment, the electrode potential of the Co layer at the boundary between the binder phase with larger crystal domains and the hard phase is greater than the electrode potential of the intermediate layer γ(Co-W-C solid solution) phase and WC, which creates a potential difference between the three, and occurs galvanic corrosion. The hard phase WC is protected as the cathode of the entire battery and has a tendency to stabilize. The Co layer at the phase boundary is the most anode feature to be corroded and dissolved first. The γ phase of the intermediate layer serves as the secondary anode feature and serves also as the cathode of the Co layer. When the Co layer at the phase boundary is corroded to a certain extent, a galvanic couple is formed between the γ phase and the testing phase WC to cause corrosion. In addition, the binder phase with smaller crystal domains directly forms galvanic corrosion with WC. TheAbstract: To explore the chemical mechanism of tungsten‑cobalt cemented carbide inserts in H2 O2 -based polishing fluid. Before and after the YG8 cemented carbide inserts were corroded, surface phase, element and structure were characterized by XRD and SEM/EDS. The chemical mechanism of tungsten‑cobalt carbide inserts during chemical mechanical polishing (CMP) was analyzed. XPS was utilized to analyze the corrosion products formed on the surface of YG8 cemented carbide inserts during chemical reaction to determine the chemical reaction equation. In the H2 O2 environment, the electrode potential of the Co layer at the boundary between the binder phase with larger crystal domains and the hard phase is greater than the electrode potential of the intermediate layer γ(Co-W-C solid solution) phase and WC, which creates a potential difference between the three, and occurs galvanic corrosion. The hard phase WC is protected as the cathode of the entire battery and has a tendency to stabilize. The Co layer at the phase boundary is the most anode feature to be corroded and dissolved first. The γ phase of the intermediate layer serves as the secondary anode feature and serves also as the cathode of the Co layer. When the Co layer at the phase boundary is corroded to a certain extent, a galvanic couple is formed between the γ phase and the testing phase WC to cause corrosion. In addition, the binder phase with smaller crystal domains directly forms galvanic corrosion with WC. The chemical products created on the surface of the blades are Co3 O4 and WO3 . However, Co3 O4 and WO3 oxide films are small in size and have little effect on material removal during polishing. When the binder phase corrosion on the blades surface reaches a critical point, the stress exerted by the polishing abrasive is basically concentrated on the WC particle surface. The strength of the WC particles that have lost the supporting effect of the binder phase becomes low and the structure becomes brittle. Under the mechanical scratching and compressive stress of the abrasive particles of the polishing solution, the smaller WC particles are directly pulled out. The surface layer of the larger WC particles is broken into WC grains, and then the surface layer is mechanically removed. Highlights: Study on chemical mechanism of tungsten‑cobalt cemented carbide inserts in H2 O2 -based polishing solution The material removal principle of tungsten‑cobalt cemented carbide inserts during CMP were analyzed The chemical action of tungsten‑cobalt carbide inserts in H2 02 is galvanic corrosion The chemical principle of tungsten‑cobalt carbide inserts was characterized by SEM/EDS, XRD and XPS … (more)
- Is Part Of:
- International journal of refractory metals & hard materials. Volume 88(2020)
- Journal:
- International journal of refractory metals & hard materials
- Issue:
- Volume 88(2020)
- Issue Display:
- Volume 88, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 88
- Issue:
- 2020
- Issue Sort Value:
- 2020-0088-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-04
- Subjects:
- Tungsten cobalt cemented carbide inserts -- Chemical mechanical polishing(CMP) -- H2O2 -- Chemical mechanism -- Galvanic corrosion
Heat resistant alloys -- Periodicals
Refractory materials -- Periodicals
Metallography -- Periodicals
Alliages réfractaires -- Périodiques
Matériaux réfractaires -- Périodiques
Métallographie -- Périodiques
Heat resistant alloys
Metallography
Refractory materials
Periodicals
Electronic journals
669.73 - Journal URLs:
- http://www.sciencedirect.com/science/journal/02634368 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.ijrmhm.2020.105179 ↗
- Languages:
- English
- ISSNs:
- 0263-4368
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4542.525420
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 12900.xml