Structure Characterization of Bi-Doped SnSe Thin Films Fabricated by Pluse Laser Deposition. (21st November 2019)

Record Type:: Journal Article
Title:: Structure Characterization of Bi-Doped SnSe Thin Films Fabricated by Pluse Laser Deposition. (21st November 2019)
Main Title:: Structure Characterization of Bi-Doped SnSe Thin Films Fabricated by Pluse Laser Deposition
Authors:: Hirayama, Yoshiki
Ishimaru, Manabu
Horide, Tomoya
Matsumoto, Kaname
Abstract:
Is Part Of:: Microscopy. Volume 68(2019)Supplement 1
Journal:: Microscopy
Issue:: Volume 68(2019)Supplement 1
Issue Display:: Volume 68, Issue 1 (2019)
Year:: 2019
Volume:: 68
Issue:: 1
Issue Sort Value:: 2019-0068-0001-0000
Page Start:: i38
Page End:: i38
Publication Date:: 2019-11-21
Subjects:: Microscopy -- Periodicals
502.825
Journal URLs:: http://jmicro.oxfordjournals.org/ ↗
http://ukcatalogue.oup.com/ ↗
DOI:: 10.1093/jmicro/dfz087 ↗
Languages:: English
ISSNs:: 2050-5698
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 12700.xml