Cite
HARVARD Citation
Bekarevich, R. et al. (n.d.). Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map. Microscopy. pp. i142-i149. [Online].
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Bekarevich, R. et al. (n.d.). Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map. Microscopy. pp. i142-i149. [Online].