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HARVARD Citation
Kurishiba, R. et al. (n.d.). B23-P-16Multi-layer Method combined with Nano-indentation, FIB and XTEM for Nano-hardness Measurement. Microscopy. p. i119. [Online].
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Kurishiba, R. et al. (n.d.). B23-P-16Multi-layer Method combined with Nano-indentation, FIB and XTEM for Nano-hardness Measurement. Microscopy. p. i119. [Online].