Evolution of microstructure and residual stresses in gradually ground/polished 3Y-TZP. Issue 4 (April 2020)

• Record Type: Journal Article
• Authors: Minguela, J.; Slawik, S.; Mücklich, F.; Ginebra, M.P.; Llanes, L.; Mas-Moruno, C.; Roa, J.J.
• Is Part Of: Journal of the European Ceramic Society. Volume 40:Issue 4(2020)
• Page Start: 1582
• Page End: 1591
• Publication Date: 2020-04
• Subjects: Zirconia -- Grinding -- Microstructure -- Phase transformation -- Residual stresses; Ceramic materials -- Periodicals; Composite materials -- Periodicals; Matériaux céramiques -- Périodiques; Composites -- Périodiques; Ceramic materials; Composite materials; Periodicals; Electronic journals; 666.05
• DOI: 10.1016/j.jeurceramsoc.2019.10.057
• Languages: English
• ISSNs: 0955-2219

Abstract

Abstract: A comprehensive study of progressively ground/polished 3Y-TZP was performed with the aim of better understanding the mechanisms driving the microstructural modifications observed after such procedures, and identifying the processing parameters leading to optimal microstructures (i.e. ageing-protective and damage-free). Gradually ground/polished surfaces were produced, yielding four different topographies of increasing roughness (grades 1–4) and two different textures (unidirectionally, U, and multidirectionally, M). Phase transformation, microstructure and residual stresses were investigated by means of advanced characterization techniques. It was found that low-roughness mildly ground/polished specimens (i.e. 2-M/U) presented a nanometric layer with the ageing-related protective features generally associated with coarsely ground specimens. A lower limit for grain refinement in terms of surface abrasion was also found, in which partial recrystallization took place (i.e. 1-M/U). A mathematical relation was established between average surface roughness (Sa ), monoclinic volume fraction (Vm ) and surface compressive residual stresses, demonstrating that if the processing parameters are controlled, both Vm and residual stresses can be predicted by the measurement of Sa .