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HARVARD Citation
Kauffmann-Weiss, S. et al. (2019). Microscopic origin of highly enhanced current carrying capabilities of thin NdFeAs(O, F) films. Nanoscale advances. 1 (8), pp. 3036-3048. [Online].
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Kauffmann-Weiss, S. et al. (2019). Microscopic origin of highly enhanced current carrying capabilities of thin NdFeAs(O, F) films. Nanoscale advances. 1 (8), pp. 3036-3048. [Online].