Cite
HARVARD Citation
Ding, C. et al. (2020). Erosion of Cu–W contact material of SF6 circuit breakers when making capacitor bank. IEEJ transactions on electrical and electronic engineering. 15 (2), pp. 187-193. [Online].
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Ding, C. et al. (2020). Erosion of Cu–W contact material of SF6 circuit breakers when making capacitor bank. IEEJ transactions on electrical and electronic engineering. 15 (2), pp. 187-193. [Online].