Deuterium concentration depth profiling in sputter-deposited tungsten coated F82H using secondary ion mass spectrometry. (December 2019)

• Record Type: Journal Article
• Authors: Xu, Y.; Hirooka, Y.; Luo, L.M.; Wu, Y.C.
• Is Part Of: Nuclear materials and energy. Volume 21(2019)
• Publication Date: 2019-12
• Subjects: Plasma-driven permeation -- SIMS -- Tungsten coatings -- F82H -- Deuterium retention; Nuclear energy -- Periodicals; Nuclear fuels -- Periodicals; Nuclear reactors -- Materials -- Periodicals; Radioactive substances -- Periodicals; 621.4833
• DOI: 10.1016/j.nme.2019.100708
• Languages: English
• ISSNs: 2352-1791

Abstract

Highlights: Sputter-deposited tungsten coatings have been found to prolong the plasma-driven permeation breakthrough time significantly, indicating that the intrinsic defects in tungsten coatings influence the diffusion of deuterium. Sputter-deposited tungsten coatings enhance deuterium retention in the first wall. SIMS shows that the deuterium concentration in tungsten coatings is much higher than that in F82H substrate, exhibiting an "uphill diffusion" profile. Abstract: Deuterium plasma-driven permeation (PDP) through reduced activation ferritic steel alloy F82H with and without sputter-deposited tungsten (SP-W) coatings has been conducted using a laboratory-scale steady-state plasma facility. SP-W coatings have been found to enhance PDP flux with a much slow breakthrough to reach steady-state. Static deuterium retention has been evaluated with thermal desorption spectroscopy. Enhanced deuterium retention in SP-W coated F82H has been observed, compared with that in bare F82H. Secondary ion mass spectrometry (SIMS) has been carried out to obtain the depth profile of deuterium concentration crossing the W/F82H interface. SIMS data indicate the deuterium concentration is much higher in W coatings than that in F82H substrate, exhibiting an "uphill diffusion" profile.