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HARVARD Citation
Cesca, T. et al. (2020). Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire. Nanoscale. 12 (2), pp. 851-863. [Online].
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Cesca, T. et al. (2020). Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire. Nanoscale. 12 (2), pp. 851-863. [Online].