Multi-spectral X-ray transmission imaging using a BSI CMOS Image Sensor. (February 2020)

• Record Type: Journal Article
• Authors: Lipovetzky, José; Cicuttin, Andrés; Crespo, María Liz; Sofo Haro, Miguel; Alcalde Bessia, Fabricio; Pérez, Martín; Gómez Berisso, Mariano
• Is Part Of: Radiation physics and chemistry. Volume 167(2020:Feb.)
• Publication Date: 2020-02
• Subjects: CMOS image detectors -- Ionizing radiation -- X-rays -- Imaging; Radiation chemistry -- Periodicals; Radiometry -- Periodicals; Radiation -- Periodicals; Chimie sous rayonnement -- Périodiques; 539.2
• DOI: 10.1016/j.radphyschem.2019.03.048
• Languages: English
• ISSNs: 0969-806X

Abstract

Abstract: In this work we study the performance to obtain X-ray images of a Back Side Illuminated CMOS Image Sensor, the Omnivision OV5647, empoying X-rays from tube with a palladium anode and voltages from 7.5 keV to 50 keV. The performance is compared with the Timepix detector operating in the Time Over Threshold mode. False color images are obtained using data from different energies and brightnesses, to fussion different information on the same picture. The different attenuations are analyzed and discussed in terms of the charge detection efficiency of the CMOS sensor, measured using Fluorescence X-rays and gamma rays from calibrated sources. Highlights: Backside Illuminated CMOS Image Sensors can be used for the acquisition of high resolution X-ray images. Complementary information can be obtained acquiring the images with X-rays from a tube with different anode voltages. Combination of data in false color pictures can provide multispectral and extended dynamic range information in a single image.