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HARVARD Citation
Sun, F. et al. (2020). A spatial-phase-shift-based defect detection shearography system with independent adjustment of shear amount and spatial carrier frequency. Optics & laser technology. p. . [Online].
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Sun, F. et al. (2020). A spatial-phase-shift-based defect detection shearography system with independent adjustment of shear amount and spatial carrier frequency. Optics & laser technology. p. . [Online].