A high angle scattering, stable amorphous metal TEM specimen for measuring the information envelop of electron microscopes. (February 2020)

• Record Type: Journal Article
• Authors: Herring, Rodney A.
• Is Part Of: Micron. Volume 129(2020)
• Publication Date: 2020-02
• Subjects: Amorphous metal -- TEM Information Envelop -- Younge fringe method; Microscopy -- Periodicals; Electron Probe Microanalysis -- Periodicals; Microscopy -- Periodicals; Microscopie -- Périodiques; Microscopy; Periodicals; 502.82
• DOI: 10.1016/j.micron.2019.102791
• Languages: English
• ISSNs: 0968-4328

Abstract

Highlights: The highlight of this paper is informing the TEM research community that a-metal makes a good specimen for measuring the information envelop. Abstract: An amorphous metal (a-metal) TEM specimen suitable for measuring the information envelop of (S)TEM electron microscopes is presented. Its features include producing high angle electron scattering intensities and having good structural stability compared with commonly used specimens of amorphous carbon (a-C) and Au islands supported on a-C substrate.