Polarized Raman spectroscopy to elucidate the texture of synthesized MoS2. Issue 47 (22nd November 2019)

• Record Type: Journal Article
• Authors: Vandalon, Vincent; Sharma, Akhil; Perrotta, Alberto; Schrode, Benedikt; Verheijen, Marcel A.; Bol, Ageeth A.
• Is Part Of: Nanoscale. Volume 11:Issue 47(2019)
• Page Start: 22860
• Page End: 22870
• Publication Date: 2019-11-22
• Subjects: Nanoscience -- Periodicals; Nanotechnology -- Periodicals; 620.505
• DOI: 10.1039/c9nr08750h
• Languages: English
• ISSNs: 2040-3364

Abstract

Abstract : Texture has a significant impact on several key properties of transition-metal dichalcogenides (TMDs) films. Abstract : Texture has a significant impact on several key properties of transition-metal dichalcogenides (TMDs) films. Films with in-plane oriented grains have been successfully implemented in nano- and opto-electronic devices, whereas, films with out-of-plane oriented material have shown excellent performance in catalytic applications. It will be demonstrated that the texture of nanocrystalline TMD films can be determined with polarized Raman spectroscopy. A model describing the impact of texture on the Raman response of 2D-TMDs will be presented. For the specific case of MoS2, the model was used to quantify the impact of texture on the relative strength of the A1g and E 1 2g modes in both the unpolarized and polarized Raman configuration. Subsequently, the capability to characterize texture by polarized Raman was demonstrated on various MoS2 films grown by atomic-layer deposition (ALD) and validated by complementary transmission electron microscopy (TEM) and synchrotron based 2D grazing-incidence X-ray diffraction (GIXD) measurements. This also revealed how the texture evolved during ALD growth of MoS2 and subsequent annealing of the films. The insights presented in this work allow a deeper understanding of Raman spectra of nanocrystalline TMDs and enable a rapid and non-destructive method to probe texture.