High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy. (15th April 2018)

• Record Type: Journal Article
• Authors: Jawaharram, Gowtham Sriram; Price, Patrick M.; Barr, Christopher M.; Hattar, Khalid; Averback, Robert S.; Dillon, Shen J.
• Is Part Of: Scripta materialia. Number 148(2018)
• Page Start: 1
• Page End: 4
• Publication Date: 2018-04-15
• Subjects: Irradiation induced creep -- Silver films -- In situ transmission electron microscopy (TEM) -- Defects; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2018.01.007
• Languages: English
• ISSNs: 1359-6462

Abstract

Abstract: Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. The data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature. Graphical abstract: Unlabelled Image