Spatially correlated electron microscopy and atom probe tomography: Current possibilities and future perspectives. (15th April 2018)

• Record Type: Journal Article
• Authors: Herbig, M.
• Is Part Of: Scripta materialia. Number 148(2018)
• Page Start: 98
• Page End: 105
• Publication Date: 2018-04-15
• Subjects: SEM -- TEM -- ECCI -- TKD -- APT; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2017.03.017
• Languages: English
• ISSNs: 1359-6462

Abstract

Abstract: Performing electron microscopy and atom probe tomography at the same location on the same specimen combines the strengths of electron microscopy, which is primarily the analysis of defects and crystal structures, with the strengths of atom probe tomography, which is primarily the robust, accurate and sensitive three dimensional compositional analysis. This viewpoint article provides a summary of the broad range of electron microscopy techniques that have been performed on atom probe specimens to date. It describes what technique is best suited to address a specific materials science question and finishes with an outlook on possible future developments in the field.