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HARVARD Citation
Mo, H. et al. (2019). Design Tradeoff of Hot Carrier Immunity and Robustness in LDMOS with Grounded Gate Shield. Active and passive electronic components. p. . [Online].
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Mo, H. et al. (2019). Design Tradeoff of Hot Carrier Immunity and Robustness in LDMOS with Grounded Gate Shield. Active and passive electronic components. p. . [Online].