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HARVARD Citation
Mukherjee, C. et al. (2020). A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions. Solid-state electronics. p. . [Online].
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Mukherjee, C. et al. (2020). A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions. Solid-state electronics. p. . [Online].