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HARVARD Citation
Park, H. et al. (n.d.). Development of accurate dose evaluation technique of X-ray inspection for quality assurance of semiconductor with Monte Carlo simulation. Applied radiation and isotopes. p. . [Online].
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Park, H. et al. (n.d.). Development of accurate dose evaluation technique of X-ray inspection for quality assurance of semiconductor with Monte Carlo simulation. Applied radiation and isotopes. p. . [Online].