March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories. (November 2019)

• Record Type: Journal Article
• Authors: Caşcaval, P.; Caşcaval, D.
• Is Part Of: Microelectronics journal. Volume 93(2019)
• Publication Date: 2019-11
• Subjects: Microelectronics -- Periodicals; Microélectronique -- Périodiques; Microelectronics; Electronic journals; Journals - contents and abstracts; Periodicals; 621.3805
• DOI: 10.1016/j.mejo.2019.104619
• Languages: English
• ISSNs: 0959-8324

Abstract

Abstract: A memory fault model regarding the unlinked static three-cell coupling faults in n × 1 random-access memories is discussed. This model is an extension of the well-known model of unlinked static two-cell coupling faults. Because this model of three-cell coupling is limited to the physically neighbouring memory cells, it can also be considered a neighbourhood pattern-sensitive model. An efficient march test algorithm able to cover this reduced model of three-cell coupling is presented in this letter.