Cite
HARVARD Citation
Niu, Y. et al. (2019). First-principle study of electronic structure and optical properties of SiC nano films. Semiconductor science and technology. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Niu, Y. et al. (2019). First-principle study of electronic structure and optical properties of SiC nano films. Semiconductor science and technology. p. . [Online].