A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source. (2019)

• Record Type: Journal Article
• Authors: Chiaramonti, Ann N.; Miaja-Avila, Luis; Blanchard, Paul T.; Diercks, David R.; Gorman, Brian P.; Sanford, Norman A.
• Is Part Of: MRS advances. Volume 4:Number 44/45(2019)
• Page Start: 2367
• Page End: 2375
• Publication Date: 2019
• Subjects: atom probe microscopy, -- interface, -- field emission, -- chemical composition, -- mass spectroscopy; Electrical engineering -- Congresses; Physics -- Congresses; Materials -- Research -- Congresses; Materials science -- Congresses; 620.11
• DOI: 10.1557/adv.2019.296
• Languages: English
• ISSNs: 2059-8521

Abstract

ABSTRACT: Pulsed coherent extreme ultraviolet (EUV) radiation is a potential alternative to pulsed near-ultraviolet (NUV) wavelengths for atom probe tomography. EUV radiation has the benefit of high absorption within the first few nm of the sample surface for elements across the entire periodic table. In addition, EUV radiation may also offer athermal field ion emission pathways through direct photoionization or core-hole Auger decay processes, which are not possible with the (much lower) photon energies used in conventional NUV laser-pulsed atom probe. We report preliminary results from what we believe to be the world's first EUV radiation-pulsed atom probe microscope. The instrument consists of a femtosecond-pulsed, coherent EUV radiation source interfaced to a local electrode atom probe tomograph by means of a vacuum manifold beamline. EUV photon-assisted field ion emission (of substrate atoms) has been demonstrated on various insulating, semiconducting, and metallic specimens. Select examples are shown.