X-ray spectrometer : Scanning spectrometer/monochromator for a wavelength range of 50–330 Å. (20th August 2019)

• Record Type: Journal Article
• Authors: Shatokhin, A N; Vishnyakov, E A; Kolesnikov, A O; Ragozin, E N
• Is Part Of: Quantum electronics. Volume 49:Number 8(2019)
• Page Start: 779
• Page End: 783
• Publication Date: 2019-08-20
• Subjects: Quantum electronics -- Periodicals; 537.5
• DOI: 10.1070/QEL17018
• Languages: English
• ISSNs: 1063-7818

Abstract

Abstract: A flat-field scanning spectrometer/monochromator of the Hettrick–Underwood type is implemented for a wavelength range λ ≈ 50–330 Å. The optical arrangement of the spectrograph comprises a focusing spherical (R = 6000 mm) mirror, mounted at a grazing angle of 8.34°, and a grazing-incidence plane varied linespace (VLS) grating operating for a constant deflection angle of 16.68°. The entrance and output slits of the instrument are immobile, and the focal distance varies only slightly over its operating spectral range. The short-wavelength boundary of the operating range is determined by the spectral source brightness and the reflection coefficients of the grating and the mirror rather than by defocusing. Laser-produced plasma spectra excited by a focused laser beam (0.5 J, 8 ns, 1.06 μm) are recorded. A spectral resolving power λ/δλ = 1300 is demonstrated at a wavelength of 182Å. The configuration of the instrument of this type is suited to soft X-ray reflectometry and metrology with the use of laser-plasma and synchrotron radiation sources, and is perfectly compatible with modern CCD detectors.