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HARVARD Citation
Rusli, N. et al. (2019). Bias voltage dependent structure and morphology evolution of magnetron sputtered YSZ thin film: a basic insight. Materials research express. p. . [Online].
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Rusli, N. et al. (2019). Bias voltage dependent structure and morphology evolution of magnetron sputtered YSZ thin film: a basic insight. Materials research express. p. . [Online].