Growth of hBN Using Metallic Boron: Isotopically Enriched h10BN and h11BN. Issue 1635 (16th January 2014)
- Record Type:
- Journal Article
- Title:
- Growth of hBN Using Metallic Boron: Isotopically Enriched h10BN and h11BN. Issue 1635 (16th January 2014)
- Main Title:
- Growth of hBN Using Metallic Boron: Isotopically Enriched h10BN and h11BN
- Authors:
- Hoffman, T.B.
Zhang, Y.
Edgar, J.H.
Gaskill, D.K. - Abstract:
- ABSTRACT: Hexagonal boron nitride (hBN) crystals enriched in 10 B and 11 B isotopes were synthesized using a high temperature (1500° C) Ni-Cr-B reactive-precipitation growth under a N2 atmosphere. Two growth mechanisms were observed: conventional defect-facilitated bulk growth which produced crystals with a platelet-like habit with width and thickness of 20-30 μm and 5 μm, respectively, and vapor-liquid-solid interface growth of hBN whiskers with lengths and diameters as large as 70 μm and 5 μm, respectively. Similar growth mechanisms were seen for samples enriched in either isotope. Isotopic analysis via secondary-ion mass spectrometry showed boron concentrations of 84.4 at% and 93.0 at% for the majority isotopes in the 10 B-rich and 11 B-rich samples, respectively. Raman spectroscopy showed an increase in peak Raman shift for the 10 B-rich sample, having two barely resolved peaks at 1393.5 and 1388.8 cm -1, and a decrease for the 11 B-rich sample, having peak at 1359.5 cm -1 (FWHM of 9.4 cm -1 ), compared to that of natural hBN, with its peak at 1365.8 cm -1 (FWHM of 10.3 cm -1 ). Raman shift showed a linear trend with increasing 10 B concentration allowing for a calibration curve to be developed to estimate 10 B enrichment in hBN using non-destructive methods.
- Is Part Of:
- MRS proceedings. Issue 1635:(2014)
- Journal:
- MRS proceedings
- Issue:
- Issue 1635:(2014)
- Issue Display:
- Volume 1635, Issue 1635 (2014)
- Year:
- 2014
- Volume:
- 1635
- Issue:
- 1635
- Issue Sort Value:
- 2014-1635-1635-0000
- Page Start:
- Page End:
- Publication Date:
- 2014-01-16
- Subjects:
- II-VI, -- crystal growth, -- secondary ion mass spectroscopy (SIMS)
Electrical engineering -- Congresses
Physics -- Congresses
Materials -- Research -- Congresses
Materials science -- Congresses
620.11 - Journal URLs:
- http://journals.cambridge.org/action/displayJournal?jid=OPL ↗
https://www.springer.com/journal/43582/ ↗
http://www.mrs.org/ ↗ - DOI:
- 10.1557/opl.2014.48 ↗
- Languages:
- English
- ISSNs:
- 0272-9172
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 11721.xml