Adhesion of tungsten particles on rough tungsten surfaces using Atomic Force Microscopy. (November 2019)
- Record Type:
- Journal Article
- Title:
- Adhesion of tungsten particles on rough tungsten surfaces using Atomic Force Microscopy. (November 2019)
- Main Title:
- Adhesion of tungsten particles on rough tungsten surfaces using Atomic Force Microscopy
- Authors:
- Peillon, Samuel
Autricque, Adrien
Redolfi, Michaël
Stancu, Cristian
Gensdarmes, François
Grisolia, Christian
Pluchery, Olivier - Abstract:
- Abstract: Adhesion forces between tungsten spherical microparticles and tungsten substrates with different roughnesses have been measured using the Atomic Force Microscopy (AFM) colloidal probe technique. Mean roughnesses of the tungsten substrates were measured by AFM and were ranked in three categories i.e. nanoscale, sub-microscale and microscale roughnesses. Experimental Hamaker constant of 37 ± 3.5 × 10 − 20 J has been obtained using a spherical tungsten particle of 10.5 μ m in radius and a tungsten substrate with nanoscale root-mean-square roughness of r m s = 11.5 nm. It was shown that larger roughness of the order r m s = 712 nm induces a two order of magnitude decrease on the adhesion of tungsten microparticles compared to a smooth tungsten surface with nanoscale roughness. Comparison with the van der Waals-based adhesion force model of Rabinovich which integrates the roughness of surfaces showed good agreement with experimental pull-off forces even when roughness of the substrate is close to the micrometer range. In such case, measurements have shown that dependency of adhesion force with particle size (in the micrometer range) has a secondary influence compared to the roughness of surfaces. Highlights: AFM measurements between tungsten particles and tungsten substrates are presented.. A strong effect of roughness (versus the size of the particle) in the reduction of adhesion on real surfaces is observed. Comparison between experiments and adhesion models emphasisAbstract: Adhesion forces between tungsten spherical microparticles and tungsten substrates with different roughnesses have been measured using the Atomic Force Microscopy (AFM) colloidal probe technique. Mean roughnesses of the tungsten substrates were measured by AFM and were ranked in three categories i.e. nanoscale, sub-microscale and microscale roughnesses. Experimental Hamaker constant of 37 ± 3.5 × 10 − 20 J has been obtained using a spherical tungsten particle of 10.5 μ m in radius and a tungsten substrate with nanoscale root-mean-square roughness of r m s = 11.5 nm. It was shown that larger roughness of the order r m s = 712 nm induces a two order of magnitude decrease on the adhesion of tungsten microparticles compared to a smooth tungsten surface with nanoscale roughness. Comparison with the van der Waals-based adhesion force model of Rabinovich which integrates the roughness of surfaces showed good agreement with experimental pull-off forces even when roughness of the substrate is close to the micrometer range. In such case, measurements have shown that dependency of adhesion force with particle size (in the micrometer range) has a secondary influence compared to the roughness of surfaces. Highlights: AFM measurements between tungsten particles and tungsten substrates are presented.. A strong effect of roughness (versus the size of the particle) in the reduction of adhesion on real surfaces is observed. Comparison between experiments and adhesion models emphasis the relevance of using rms roughness of surfaces in contact. Experimental value for the Hamaker constant of tungsten has been found in good agreement with theoretical values. … (more)
- Is Part Of:
- Journal of aerosol science. Volume 137(2019)
- Journal:
- Journal of aerosol science
- Issue:
- Volume 137(2019)
- Issue Display:
- Volume 137, Issue 2019 (2019)
- Year:
- 2019
- Volume:
- 137
- Issue:
- 2019
- Issue Sort Value:
- 2019-0137-2019-0000
- Page Start:
- Page End:
- Publication Date:
- 2019-11
- Subjects:
- Adhesion -- Roughness -- Tungsten -- Hamaker constant -- Atomic force microscopy
Aerosols -- Periodicals
Aerosols -- Periodicals
Aérosols -- Périodiques
541.34515 - Journal URLs:
- http://www.journals.elsevier.com/journal-of-aerosol-science/ ↗
http://www.sciencedirect.com/science/journal/00218502 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.jaerosci.2019.105431 ↗
- Languages:
- English
- ISSNs:
- 0021-8502
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4919.060000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 11665.xml