X‐ray reflecto‐interferometer based on compound refractive lenses. (12th August 2019)

• Record Type: Journal Article
• Authors: Lyatun, S.; Zverev, D.; Ershov, P.; Lyatun, I.; Konovalov, O.; Snigireva, I.; Snigirev, A.
• Is Part Of: Journal of synchrotron radiation. Volume 26:Part 5(2019)
• Page Start: 1572
• Page End: 1581
• Publication Date: 2019-08-12
• Subjects: spatial resolution -- temporal resolution -- interferograms -- reflecto‐interferometers -- compound refractive lenses -- X‐ray interferometry; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577519007896
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : An X‐ray amplitude‐splitting interferometer based on compound refractive lenses, which operates in the reflection mode, is proposed and realized. Abstract : An X‐ray amplitude‐splitting interferometer based on compound refractive lenses, which operates in the reflection mode, is proposed and realized. The idea of a reflecto‐interferometer is to use a very simplified experimental setup where a focused X‐ray beam reflected from parallel flat surfaces creates an interference pattern in a wide angular range. The functional capabilities of the interferometer were experimentally tested at the European Synchrotron Radiation Facility (ESRF) ID06 beamline in the X‐ray energy range from 10 keV to 15 keV. The main features of the proposed approach, high spatial and temporal resolution, were demonstrated experimentally. The reflections from free‐standing Si3 N4 membranes, gold and resist layers were studied. Experimentally recorded interferograms are in good agreement with our simulations. The main advantages and future possible applications of the reflecto‐interferometer are discussed.