Cite
HARVARD Citation
Nanekar, P. et al. (2019). Characterization of planar flaws by an integrated approach using phased array and synthetic aperture focusing technique. Measurement. p. . [Online].
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Nanekar, P. et al. (2019). Characterization of planar flaws by an integrated approach using phased array and synthetic aperture focusing technique. Measurement. p. . [Online].