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HARVARD Citation
Beainy, G. et al. (2018). Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography. Scripta materialia. pp. 109-113. [Online].
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Beainy, G. et al. (2018). Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography. Scripta materialia. pp. 109-113. [Online].