Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film Structures. (7th November 2010)

• Record Type: Journal Article
• Authors: Barybin, Anatoly; Shapovalov, Victor
• Other Names: Elliman Robert G. Academic Editor.
• Is Part Of: International journal of optics. Volume 2010(2010)
• Publication Date: 2010-11-07
• Subjects: Optics -- Periodicals; Optics; Periodicals; 535
• DOI: 10.1155/2010/137572
• Languages: English
• ISSNs: 1687-9392

Abstract

Abstract : A rigorous and consistent approach is demonstrated to develop a model of the 4M structure (the four-media structure of a film on a substrate of finite thickness). The general equations obtained for the reflectance and transmittance spectra of the 4M structure are simplified by employing a procedure of the so-called device averaging to reduce them to a succinct form convenient for processing of experimental spectra for the structures with a thick substrate. The newly derived equations are applied to two special cases: (i) an arbitrary film on highly absorbing substrates and (ii) a slightly absorbing film on transparent substrates. The reflectance and transmittance spectra represented in the simplified (with the device averaging) form have a practical application for determining the film thickness and optical constants from experimental spectra by using the known techniques.