Cite
HARVARD Citation
Hao, S. et al. (2018). Reliability analysis for dependent competing failure processes with changing degradation rate and hard failure threshold levels. Computers & industrial engineering. pp. 340-351. [Online].
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Hao, S. et al. (2018). Reliability analysis for dependent competing failure processes with changing degradation rate and hard failure threshold levels. Computers & industrial engineering. pp. 340-351. [Online].