Cite
HARVARD Citation
Chen, X. et al. (n.d.). Analysis of the relationship between the contact barrier and rectification ratio in a two-dimensional P–N heterojunction. Semiconductor science and technology. p. . [Online].
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Chen, X. et al. (n.d.). Analysis of the relationship between the contact barrier and rectification ratio in a two-dimensional P–N heterojunction. Semiconductor science and technology. p. . [Online].